AbstractThe photon pressure exerted on thin film and small particles, which are located in the evanescent field near the surface of a high refractive‐index prism, is studied. The mechanism of the movement of particles in the evanescent field is first discussed, and the calculations resulting from the force exertion on the film by the evanescent field are shown in the different conditions of film thickness, spacing from the surface to the film, incident angle and polarization of the laser beam, with the data of the electric‐field intensity distribution. It is found from these results that the force on the film near the substrate could change the action from pulling to pushing it by changing the parameters. It is also found that at a certain condition of incident angle and polarization, a trapping (levitation) force will occur on the film towards a given position above the surface of the substr