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Specimen surface preparation errors in quantitative electron‐probe microanalysis

 

作者: J. I. Bramman,   G. Yates,  

 

期刊: Journal of Applied Crystallography  （WILEY Available online 1969）
卷期: Volume 2, issue 1  

页码: 18-24

 

ISSN:1600-5767

 

年代: 1969

 

DOI:10.1107/S002188986900642X

 

出版商: International Union of Crystallography

 

数据来源: WILEY

 

摘要:

The usual method of specimen preparation for electron‐probe microanalysis can introduce errors of up to about ±3% in the estimates of the amount of an element present. It is believed that these errors are caused by the formation of `flowed' layers on the surfaces of polished samples. Two methods of reducing the errors are describ

 

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