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Growth of device quality GaN at 550 °C by atomic layer epitaxy

 

作者: N. H. Karam,   T. Parodos,   P. Colter,   D. McNulty,   W. Rowland,   J. Schetzina,   N. El‐Masry,   Salah M. Bedair,  

 

期刊: Applied Physics Letters  (AIP Available online 1995)
卷期: Volume 67, issue 1  

页码: 94-96

 

ISSN:0003-6951

 

年代: 1995

 

DOI:10.1063/1.115519

 

出版商: AIP

 

数据来源: AIP

 

摘要:

GaN single crystal films were grown by atomic layer epitaxy at 550 °C. The room temperature photoluminescence properties of these low‐temperature‐grown films are dominated by band edge emission with intensity comparable to those grown by metalorganic chemical vapor deposition at 1000 °C. The as‐grown films have background‐carrier concentrations that can be controlled to levels in the 1016/cm−3range. Atomic layer epitaxy is therefore a good approach to the low temperature growth of nitride compounds. ©1995 American Institute of Physics.

 

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