An integrated scanning tunneling, atomic force and lateral force microscope
作者:
L. A. Wenzler,
T. Han,
R. S. Bryner,
T. P. Beebe,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 1
页码: 85-88
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144752
出版商: AIP
数据来源: AIP
摘要:
We describe the design and operation of a combined scanning tunneling–atomic force–lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously; a simple reconfiguration (requiring removing the AFM/LFM cantilever holder and replacing with a STM tip) changes the instrument into a STM. We present atomic forces depicted in force‐to‐distance curves and experimental imaging applications with all three techniques.
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