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Scan speed limit in atomic force microscopy

 

作者: H.‐J. BUTT,   P. SIEDLE,   K. SEIFERT,   K. FENDLER,   T. SEEGER,   E. BAMBERG,   A. L. WEISENHORN,   K. GOLDIE,   A. ENGEL,  

 

期刊: Journal of Microscopy  (WILEY Available online 1993)
卷期: Volume 169, issue 1  

页码: 75-84

 

ISSN:0022-2720

 

年代: 1993

 

DOI:10.1111/j.1365-2818.1993.tb03280.x

 

出版商: Blackwell Publishing Ltd

 

关键词: Scanning force microscope;AFM;STM;resonance frequency;damping constant

 

数据来源: WILEY

 

摘要:

SUMMARYThe scan speed limit of atomic force microscopes has been calculated. It is determined by the spring constant of the cantileverk, its effective massm, the damping constantDof the cantilever in the surrounding medium and the stiffness of the sample. Techniques to measurek, k/mandD/mare described. In liquids the damping constant and the effective mass of the cantilever increase. A consequence of this is that the transfer function always depends on the scan speed when imaging in liquids. The practical scan speed limit for atomic resolution in vacuum is 0·1 μm/s while in water it increases to about 2 μm/s due to the additional damping of cantilever movements. Sample stiffness or damping of cantilever movements by the sample increase these limits. For soft biological materials imaged in water at a desired resolution of 1 nm the scan speed should not exceed 2 μ

 

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