A stochastic model for microplasma noise
作者:
N. Ellouze,
J. C. Hoffmann,
B. Lacaze,
期刊:
Journal of Applied Physics
(AIP Available online 1978)
卷期:
Volume 49,
issue 1
页码: 297-300
ISSN:0021-8979
年代: 1978
DOI:10.1063/1.324383
出版商: AIP
数据来源: AIP
摘要:
Taking a simple branching process as model of the carrier multiplication in reverse junctions, the turn‐on probability of a microplasma is determined. Considering the variation of the voltage and current in the diode, the distribution of the off‐state time interval is deduced. Finally, expressions for the amplitude distribution as well as the rate of discharges in units of time are developed in the case where the on‐time is negligible.
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