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Environmental degradation of AlxGa1−xAs‐GaAs quantum‐well heterostructures

 

作者: J. M. Dallesasse,   N. El‐Zein,   N. Holonyak,   K. C. Hsieh,   R. D. Burnham,   R. D. Dupuis,  

 

期刊: Journal of Applied Physics  (AIP Available online 1990)
卷期: Volume 68, issue 5  

页码: 2235-2238

 

ISSN:0021-8979

 

年代: 1990

 

DOI:10.1063/1.346527

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Data describing the deterioration of AlxGa1−xAs‐GaAs heterostructures in long‐term exposure (2–12 years) to normal room environmental conditions (∼20–25 °C, varying humidity) are presented. Optical microscopy, scanning electron microscopy, transmission electron microscopy, and electron dispersion x‐ray spectroscopy are used to examine AlxGa1−xAs‐GaAs quantum‐well heterostructure material that has hydrolyzed at cleaved edges, cracks, and fissures, and at pinholes in cap layers. The hydrolysis is found to be significant for thicker (>0.1 &mgr;m) AlxGa1−xAs layers of higher composition (x>0.85).

 

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