Environmental degradation of AlxGa1−xAs‐GaAs quantum‐well heterostructures
作者:
J. M. Dallesasse,
N. El‐Zein,
N. Holonyak,
K. C. Hsieh,
R. D. Burnham,
R. D. Dupuis,
期刊:
Journal of Applied Physics
(AIP Available online 1990)
卷期:
Volume 68,
issue 5
页码: 2235-2238
ISSN:0021-8979
年代: 1990
DOI:10.1063/1.346527
出版商: AIP
数据来源: AIP
摘要:
Data describing the deterioration of AlxGa1−xAs‐GaAs heterostructures in long‐term exposure (2–12 years) to normal room environmental conditions (∼20–25 °C, varying humidity) are presented. Optical microscopy, scanning electron microscopy, transmission electron microscopy, and electron dispersion x‐ray spectroscopy are used to examine AlxGa1−xAs‐GaAs quantum‐well heterostructure material that has hydrolyzed at cleaved edges, cracks, and fissures, and at pinholes in cap layers. The hydrolysis is found to be significant for thicker (>0.1 &mgr;m) AlxGa1−xAs layers of higher composition (x>0.85).
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