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Single atom image contrast: conventional dark‐field and bright‐field electron microscopy

 

作者: Wah Chiu,   Robert M. Glaeser,  

 

期刊: Journal of Microscopy  (WILEY Available online 1975)
卷期: Volume 103, issue 1  

页码: 33-54

 

ISSN:0022-2720

 

年代: 1975

 

DOI:10.1111/j.1365-2818.1975.tb04535.x

 

出版商: Blackwell Publishing Ltd

 

数据来源: WILEY

 

摘要:

SUMMARYSingle atom image intensities are calculated for bright‐field and various dark‐field modes, including the ideal beam stop, a wire beam stop, tilted illumination and a displaced aperture. Comparisons of scattering amplitudes and elastic scattering cross‐sections are made with different object potentials and scattering formulations. The image contrast for one mercury atom (Z= 80) on a column of carbon atoms (Z= 6) as the substrate is also discussed for both the bright‐field and the various dark‐field situations. A list of abbreviations to be used in the text is sh

 

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