Single atom image contrast: conventional dark‐field and bright‐field electron microscopy
作者:
Wah Chiu,
Robert M. Glaeser,
期刊:
Journal of Microscopy
(WILEY Available online 1975)
卷期:
Volume 103,
issue 1
页码: 33-54
ISSN:0022-2720
年代: 1975
DOI:10.1111/j.1365-2818.1975.tb04535.x
出版商: Blackwell Publishing Ltd
数据来源: WILEY
摘要:
SUMMARYSingle atom image intensities are calculated for bright‐field and various dark‐field modes, including the ideal beam stop, a wire beam stop, tilted illumination and a displaced aperture. Comparisons of scattering amplitudes and elastic scattering cross‐sections are made with different object potentials and scattering formulations. The image contrast for one mercury atom (Z= 80) on a column of carbon atoms (Z= 6) as the substrate is also discussed for both the bright‐field and the various dark‐field situations. A list of abbreviations to be used in the text is sh
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