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A noninvasive bunch length monitor for femtosecond electron bunches

 

作者: D. X. Wang,   G. A. Kraft,   E. Price,   P. A. D. Wood,   D. W. Porterfield,   T. W. Crowe,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 4  

页码: 529-531

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.118423

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art “bandpass” GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor’s performance. ©1997 American Institute of Physics.

 

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