A noninvasive bunch length monitor for femtosecond electron bunches
作者:
D. X. Wang,
G. A. Kraft,
E. Price,
P. A. D. Wood,
D. W. Porterfield,
T. W. Crowe,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 70,
issue 4
页码: 529-531
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.118423
出版商: AIP
数据来源: AIP
摘要:
A bunch length monitor for ultrashort (90 fs to 1 ps) electron bunches using a coherent synchrotron radiation detection techniques has been developed in a collaboration between the Thomas Jefferson National accelerator Facility (Jefferson Lab) and the University of Virginia. The noninvasive, high-resolution, high-sensitivity, low-noise monitor employs a state-of-the-art “bandpass” GaAs Schottky whisker diode operated at room temperature. This letter presents the monitor’s performance. ©1997 American Institute of Physics.
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