The effective dissipation inNb/AlOx/NbJosephson tunnel junctions by return current measurements
作者:
R. Cristiano,
L. Frunzio,
C. Nappi,
M. G. Castellano,
G. Torrioli,
C. Cosmelli,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 81,
issue 11
页码: 7418-7426
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.365282
出版商: AIP
数据来源: AIP
摘要:
Measurements of temperature dependence of the return current in high qualityNb/AlOx/NbJosephson junctions are presented. From the experimental data, we obtain the effective resistance, i.e., the effective dissipation, for the retrapping process, according to the generalized resistively shunted junction model proposed by Chen, Fisher, and Leggett. We present a careful analysis, based on a comparison between the measured temperature dependencies of both the return and the quasiparticle tunneling current. We find that the junction subgap conductance, which includes the quasiparticle and the quasiparticle-pair interference terms, is responsible for the return process. The measurements have been performed on various samples, in a wide range of critical current densities from 50 to2250 A/cm2,covering different damping regimes and spanning over the high and low temperature limits. Junctions with low critical current density show ideal dissipation which makes the return current scale with temperature according to the BCS exponential behavior without flattening out effects. This result may be relevant for the possible use ofNb/AlOx/Nbjunctions in macroscopic quantum coherence experiments, which strongly require a very low dissipation. ©1997 American Institute of Physics.
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