Supposing that an insulator is charged‐up negatively by an accumulation of incident primary electrons, we study how much the subsequent incident electron is influenced by the charge in the specimen. We introduce a new Monte Carlo simulation model of electron scattering in a solid taking into account an electric field around the simulated electron. In a present study the incident electron energy is 20 keV, and the insulator is a poly‐methyl‐methacrylate wafer of 1 mm in thickness. This paper clarifies the changes in some physical quantities, e.g., the backscattering coefficient, energy deposition, etc. due to the specimen charging during an electron beam irradiation.