Registration mark detection in electron beam proximity printing
作者:
P. Nehmiz,
U. Behringer,
H. Bohlen,
M. Kallmeyer,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena
(AIP Available online 1983)
卷期:
Volume 1,
issue 4
页码: 1023-1027
ISSN:0734-211X
年代: 1983
DOI:10.1116/1.582667
出版商: American Vacuum Society
关键词: proximity effect;lithography;electron beams;pattern recognition;masking;positioning;alignment;pmma;integrated circuits;resolution
数据来源: AIP
摘要:
Electron beam proximity printing is a lithography method for high throughput exposure of repetitive patterns with submicron structures. An electron beam shadow projects the pattern contained in a transmission mask onto the wafer. Pattern registration in this projection printer is achieved by using the electron beam current absorbed in the wafer. Two registration steps are employed: one for wafer (or global) align, the other for chip (or local) align. The achieved registration accuracy is better than 0.1 μm using 10 keV electrons and 1.1 μm thick PMMA on the wafer registration marks.
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