Techniques for analytically determining surface potential and mobility of an m.o.s. transistor
作者:
W.V.Backensto,
C.R.Viswanathan,
期刊:
IEE Proceedings I (Solid-State and Electron Devices)
(IET Available online 1980)
卷期:
Volume 127,
issue 2
页码: 81-86
年代: 1980
DOI:10.1049/ip-i-1.1980.0015
出版商: IEE
数据来源: IET
摘要:
Techniques for evaluating the surface potential and the effective surface mobility of a m.o.s. transistor are described. These techniques include determination of the fixed oxide charge density, the surface-state charge density and the average donor concentration. The surface potential is evaluated as a function of gate voltage, because this dependence is necessary in order to calculate the density of surface states from charge-pumping measurements. The effective surface mobility is evaluated as a function of bias, because this dependence is necessary in order to develop a bias-dependent 1/fnoise model of a m.o.s. transistor.
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