A computer program to analyze x‐ray diffraction films
作者:
Jeffrey H. Nguyen,
Raymond Jeanloz,
期刊:
Review of Scientific Instruments
(AIP Available online 1993)
卷期:
Volume 64,
issue 12
页码: 3456-3461
ISSN:0034-6748
年代: 1993
DOI:10.1063/1.1144267
出版商: AIP
数据来源: AIP
摘要:
We have developed a Macintosh computer program to analyze Debye–Scherrer x‐ray powder diffraction films digitized with a conventional scanner. The program uses a fast derivatives‐free procedure to fit distorted ellipses corresponding to the diffraction rings on the film. These ellipses are collapsed into a one‐dimensional plot of intensity versus scattering angle, from which one can extract information about the diffraction pattern that would have been lost in visual reading. Moreover, uncertainties are decreased by a factor of ∼30 over visual reading, and the analysis of diffraction films is reduced to a matter of minutes.
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