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Direct observation of GaAs atomic layer epitaxy by reflection high‐energy electron diffraction

 

作者: T. H. Chiu,  

 

期刊: Applied Physics Letters  (AIP Available online 1989)
卷期: Volume 55, issue 12  

页码: 1244-1246

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.101666

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Atomic layer epitaxy (ALE) of GaAs using trimethylgallium and triethylgallium by chemical beam epitaxy is reported. Reflection high‐energy electron diffraction is employed to monitor the formation of each individual monolayer directly. A new (4×8) surface reconstruction, characteristic of an ordered chemisorbed molecular Ga monolayer, is observed for the first time. Each Ga atom in this transitional layer has at least one alkyl radical cleaved away. The stability of this transitional stage varies depending on the alkyl group involved and the temperature. Dynamical evolution of this adsorbed layer is described. The chemical properties of this overlayer dictate the GaAs ALE growth conditions.

 

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