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Goniometer attachment for low‐speed diamond wafering saws

 

作者: M. B. Hintz,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1983)
卷期: Volume 54, issue 6  

页码: 773-774

 

ISSN:0034-6748

 

年代: 1983

 

DOI:10.1063/1.1137444

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The construction of a compact, two‐axis goniometer that has been designed specifically for use on commonly available low‐speed diamond wafering saws is described. The device can be easily attached to practically any back reflection Laue camera and is, therefore, suitable for the orientation and cutting of single crystals parallel to particular crystallographic planes or directions. It is both simple and inexpensive to construct.

 

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