Improved value for the silicon intrinsic carrier concentration at 300 K
作者:
A. B. Sproul,
M. A. Green,
J. Zhao,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 57,
issue 3
页码: 255-257
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103707
出版商: AIP
数据来源: AIP
摘要:
A recent review suggests that the commonly cited value of 1.45×1010cm−3for the silicon intrinsic carrier concentration at 300 K is inconsistent with the best experimental and theoretical results. An alternative value of 1.08×1010cm−3was suggested. A new experimental measurement of 1.01×1010cm−3is reported with an estimated one standard deviation uncertainty of only 3%. This appears to be the most accurate experimental determination of this parameter at any temperature.
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