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Distortion‐free, calibrated LiNbO3piezoscanner for probe microscopes with atomic resolution

 

作者: U. Heider,   O. Weis,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1993)
卷期: Volume 64, issue 12  

页码: 3534-3537

 

ISSN:0034-6748

 

年代: 1993

 

DOI:10.1063/1.1144279

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We developed a piezoelectric scanner for probe microscopes that uses only single‐domain LiNbO3crystals as a piezoelectric transducer material in order to avoid nonlinearity, hysteresis, and creep that is always present in piezoelectric ceramics. A raster area of about 50×50 nm2is within reach of a scanner that uses three double‐plate translators and a scanning voltage of 300 V peak to peak. The performance of monocrystal scanners for investigations in the range of atomic resolution is demonstrated by imaging the well‐known surface of highly oriented pyrolytic graphite.

 

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