Measurement of the impact ionization rates in Al0.06Ga0.94Sb
作者:
H. Kuwatsuka,
T. Mikawa,
S. Miura,
N. Yasuoka,
Y. Kito,
T. Tanahashi,
O. Wada,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 57,
issue 3
页码: 249-251
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103705
出版商: AIP
数据来源: AIP
摘要:
We measured impact ionization rates in AlxGa1−xSb atx=0.06, where the band‐gap energyEgequals the spin‐orbital splitting energy &Dgr;, in an electric field of 1.5×105–3.2×105V/cm. By considering exact field profile in the depletion layer for each sample, the ionization rates of AlxGa1−xSb have been determined to be &agr;=2.35×106 exp(−1.30×106/E) and &bgr;=9.02×105 exp(−9.03×105/E). Although our data have not shown the resonant enhancement of hole ionization rates described by O. Hildebrand, W. Kuebart, and M. Pilkuhn [Appl. Phys. Lett.37, 801 (1980)], exact values of impact ionization rates have been established in practical electric fields required for designing AlxGa1−xSb avalanche photodiodes.
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