Extraction of C60cluster ion beam
作者:
Sun Chuanchen,
Gao Haibin,
Fang Dufei,
期刊:
Review of Scientific Instruments
(AIP Available online 1994)
卷期:
Volume 65,
issue 4
页码: 1405-1407
ISSN:0034-6748
年代: 1994
DOI:10.1063/1.1144976
出版商: AIP
数据来源: AIP
摘要:
A C+60ion beam was extracted from a hollow cathode ion source (model 911A). The mass spectra of 6 keV C60and its fragments have been measured. Only those clusters with an even number of C atoms were observed and the largest one was C84. The result shows that the fragment ion beam has an exponential distribution, which is similar to that of C+60–H2(He) collision experiments. We also have extracted C‐cluster negative‐ion beams from a Middleton 860 sputtering source. With a graphite cathode, we have observed many cluster ions which were not previously reported. For a C60/C70cathode, we have obtained a stable C−60ion beam with current of about 1 nA. The spectra of the negative ions are complicated due to the existence of the Cs–Cnclusters.
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