In situ observation of smectic layer reorientation during the switching of a ferroelectric liquid crystal
作者:
R.A. M. Hikmet,
期刊:
Liquid Crystals
(Taylor Available online 1995)
卷期:
Volume 18,
issue 6
页码: 927-932
ISSN:0267-8292
年代: 1995
DOI:10.1080/02678299508036713
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
A thin plastic cell containing the ferroelectric liquid crystal ZLI3654 (4 μm) was placed edge-on to a pin-hole collimated horizontal X-ray beam. In this way, the smectic layers were brought into register. Subsequently, triangular voltage waves with various peak (Vp) values were applied across the cell and diffraction photos were obtained during the application of the alternating voltage. Up toVp= ± 30 V, no significant movements in the initial tilted orientation of the smectic layers with respect to the surfaces (chevrons) could be observed. During the application ofVp= ± 32 V an increasing fraction of the smectic layers changed their initial tilt angle with respect to the cell surfaces to make larger tilt angles. At a slightly higher voltage, the layers became upright (bookshelf structure). Upon removing the voltage and short circuiting the cell, the quasi-bookshelf structure was sustained. The new method described here can be used in combination with a fast detector for time resolved experiments.
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