首页   按字顺浏览 期刊浏览 卷期浏览 Structure and stability of passivating arsenic sulfide phases on GaAs surfaces
Structure and stability of passivating arsenic sulfide phases on GaAs surfaces

 

作者: C. J. Sandroff,   M. S. Hegde,   C. C. Chang,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena  (AIP Available online 1989)
卷期: Volume 7, issue 4  

页码: 841-844

 

ISSN:0734-211X

 

年代: 1989

 

DOI:10.1116/1.584611

 

出版商: American Vacuum Society

 

关键词: ARSENIC SULFIDES;CHEMISORPTION;GALLIUM ARSENIDES;SURFACE REACTIONS;SODIUM SULFIDES;AMMONIUM COMPOUNDS;SULFIDES;DECOMPOSITION;PHOTOELECTRON SPECTROSCOPY;SURFACE TREATMENTS;COATINGS;PASSIVATION;ELECTRONIC STRUCTURE;AsxSiy;GaAs

 

数据来源: AIP

 

摘要:

Passivating AsxSyphases that form on GaAs after reactions with aqueous sulfides [Na2S⋅9H2O and (NH4)2S] decompose in the presence of oxygen and light, producing a surface composed primarily of As2O3. X‐ray photoelectron spectroscopy (XPS) shows that (NH4)2S‐treated surfaces degrade in two steps with the initial AsxSy(present as a disulfide) degrading by S–S bond cleavage to yield As2O3and an As2S3phase like the one that forms on GaAs after Na2S⋅9H2O reactions. XPS reveals little decomposition of surface sulfides in the presence of light or oxygen alone, showing that GaAs passivation could be made long‐lived if either is rigorously excluded.

 

点击下载:  PDF (332KB)



返 回