Structure and stability of passivating arsenic sulfide phases on GaAs surfaces
作者:
C. J. Sandroff,
M. S. Hegde,
C. C. Chang,
期刊:
Journal of Vacuum Science&Technology B: Microelectronics Processing and Phenomena
(AIP Available online 1989)
卷期:
Volume 7,
issue 4
页码: 841-844
ISSN:0734-211X
年代: 1989
DOI:10.1116/1.584611
出版商: American Vacuum Society
关键词: ARSENIC SULFIDES;CHEMISORPTION;GALLIUM ARSENIDES;SURFACE REACTIONS;SODIUM SULFIDES;AMMONIUM COMPOUNDS;SULFIDES;DECOMPOSITION;PHOTOELECTRON SPECTROSCOPY;SURFACE TREATMENTS;COATINGS;PASSIVATION;ELECTRONIC STRUCTURE;AsxSiy;GaAs
数据来源: AIP
摘要:
Passivating AsxSyphases that form on GaAs after reactions with aqueous sulfides [Na2S⋅9H2O and (NH4)2S] decompose in the presence of oxygen and light, producing a surface composed primarily of As2O3. X‐ray photoelectron spectroscopy (XPS) shows that (NH4)2S‐treated surfaces degrade in two steps with the initial AsxSy(present as a disulfide) degrading by S–S bond cleavage to yield As2O3and an As2S3phase like the one that forms on GaAs after Na2S⋅9H2O reactions. XPS reveals little decomposition of surface sulfides in the presence of light or oxygen alone, showing that GaAs passivation could be made long‐lived if either is rigorously excluded.
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