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Mass Spectrometer Ion Source with High Yield

 

作者: D. L. Swingler,  

 

期刊: Journal of Applied Physics  (AIP Available online 1970)
卷期: Volume 41, issue 4  

页码: 1496-1499

 

ISSN:0021-8979

 

年代: 1970

 

DOI:10.1063/1.1659062

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An electron impact ion source suitable for use with a quadrupole mass filter is described. Ion formation occurs throughout a relatively large volume since no magnetic field collimation of the ionization electron stream is used. A sensitivity of 8 Torr−1was obtained for an ion energy of 50 eV rising to a constant sensitivity of 12 Torr−1for ion energies in excess of 250 eV. Trajectory tracing has been used to give some insight into the efficient operation of the ion source.

 

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