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Atomic displacement processes in irradiated amorphous and crystalline silicon

 

作者: K. Nordlund,   R. S. Averback,  

 

期刊: Applied Physics Letters  (AIP Available online 1997)
卷期: Volume 70, issue 23  

页码: 3101-3103

 

ISSN:0003-6951

 

年代: 1997

 

DOI:10.1063/1.119104

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ion beam mixing was investigated in crystalline and amorphous Si using molecular dynamics simulations. The magnitude of mixing was found to be larger in amorphous Si by a factor of about 2. The difference is attributed to local relaxation mechanisms occurring during the cooling down phase of the cascade. Comparison of mixing between Si and Al shows that short range structural order also has a significant influence on mixing. ©1997 American Institute of Physics.

 

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