Spatially resolved analyses of epitaxial and electrical properties of YBa2Cu3O7devices
作者:
N. Dieckmann,
A. Bock,
U. Merkt,
期刊:
Applied Physics Letters
(AIP Available online 1996)
卷期:
Volume 68,
issue 25
页码: 3626-3628
ISSN:0003-6951
年代: 1996
DOI:10.1063/1.115751
出版商: AIP
数据来源: AIP
摘要:
We use scanning micro‐Raman spectroscopy (SMRS) to characterize the epitaxial film quality as well as low‐temperature scanning laser microscopy (LTSLM) to image electrical properties of YBa2Cu3O7devices locally in both lateral dimensions. Investigations have been performed on crossovers as used in flux transformers of magnetometers, patterned in a multilayer process on SrTiO3(100) substrates. We find a correlation between an inhomogeneous superconducting performance and a disturbance of epitaxy on locations where the crossovers pass edges of the underlying bridge. The distribution of the oxygen is not affected at these points. ©1996 American Institute of Physics.
点击下载:
PDF
(249KB)
返 回