Scanning tunneling microscopy imaging of transition‐metal dichalcogenides
作者:
G. P. E. M. van Bakel,
J. Th. M. De Hosson,
T. Hibma,
期刊:
Applied Physics Letters
(AIP Available online 1990)
卷期:
Volume 56,
issue 24
页码: 2402-2404
ISSN:0003-6951
年代: 1990
DOI:10.1063/1.103250
出版商: AIP
数据来源: AIP
摘要:
Structural features of TiS2were studied by scanning tunneling microscopy (STM) and single‐crystal x‐ray diffraction was applied as a complementary technique. STM images in air and at room temperature revealed, besides the trigonal symmetry of the lattice, several new features having this symmetry as well. We conclude that these features are not only to be described by structural defect phenomena which affect sites in the 1T‐CdI2structure but tetrahedral sites as well. Sample orientation determination by x‐ray diffraction provides a unique relation between feature types and sites. A model is proposed in which displaced Ti atoms account for the observed features.
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