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Intrinsic fracture energy of polycrystalline silicon nitride

 

作者: Giuseppe Pezzotti,   Isao Tanaka,   Toshihiko Nishida,  

 

期刊: Philosophical Magazine Letters  (Taylor Available online 1993)
卷期: Volume 67, issue 2  

页码: 95-100

 

ISSN:0950-0839

 

年代: 1993

 

DOI:10.1080/09500839308243858

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The fracture surface energy of a dense pure polycrystalline sample of silicon nitride (Si3N4) has been measured at room temperature by the work-of-fracture method on chevron-notched bend bars. Dense specimens were fabricated by hot isostatically pressing highly pure Si3N4starting powder at 1950°C under 180 MPa via glass encapsulation. Annealing experiments at 1750°C in a nitrogen atmosphere were also conducted after sintering in order to release internal residual stresses possibly arising from cooling down under high pressure. A value of 10–7 ± 0–8 J m−2was measured in both as-sintered and annealed specimens. According to fractographic observation and calculation of the theoretical compliance of the notched specimen, the present value is regarded as the intrinsic fracture energy of Si3N4and is to be compared with the markedly higher values commonly measured in alloyed materials.

 

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