The computation of transmission electron microscope image profiles for dislocation loops in GaAs
作者:
S. P. Ardren,
C. A. B. Ball,
J. H. Neethling,
H. C. Snyman,
期刊:
Journal of Applied Physics
(AIP Available online 1986)
卷期:
Volume 60,
issue 3
页码: 965-967
ISSN:0021-8979
年代: 1986
DOI:10.1063/1.337338
出版商: AIP
数据来源: AIP
摘要:
The two‐beam dynamical theory of electron diffraction has been used to calculate transmission electron microscope image profiles for small dislocation loops in GaAs. It is shown that the method of matching computed and experimental image profiles of loops is useful in the determination of their Burgers vectors. The results also indicate that the isotropic elasticity theory may be used to a good approximation for GaAs.
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