Artifacts in transmission electron microscope images of artificially layered metallic superlattices
作者:
C. S. Baxter,
W. M. Stobbs,
期刊:
Applied Physics Letters
(AIP Available online 1986)
卷期:
Volume 48,
issue 18
页码: 1202-1204
ISSN:0003-6951
年代: 1986
DOI:10.1063/1.96468
出版商: AIP
数据来源: AIP
摘要:
Both uniform and irregular artificially layered superlattice structures can exhibit a variety of misleading image artifacts in transmission electron microscopy when the layer normal is not perpendicular to the beam direction. These include apparent ‘‘layer dislocations,’’ and the origins of these and other artifacts, as observed in Cu/NiPd superlattices, are discussed.
点击下载:
PDF
(283KB)
返 回