首页   按字顺浏览 期刊浏览 卷期浏览 Optical diffraction pattern measurements using a self‐scanning photodiode array interfa...
Optical diffraction pattern measurements using a self‐scanning photodiode array interfaced to a microcomputer

 

作者: James T. Wesley,   Anthony F. Behof,  

 

期刊: American Journal of Physics  （AIP Available online 1987）
卷期: Volume 55, issue 9  

页码: 835-844

 

ISSN:0002-9505

 

年代: 1987

 

DOI:10.1119/1.15000

 

出版商: American Association of Physics Teachers

 

关键词: MICROPROCESSORS;LIGHT DIFFRACTION;ARRAYS;PHOTODIODES;EQUIPMENT INTERFACES;PATTERN RECOGNITION;BENCH−SCALE EXPERIMENTS;OPTICAL SYSTEMS;USES

 

数据来源: AIP

 

摘要:

A system for recording and analyzing optical diffraction patterns using a self‐scanning photodiode array interfaced to a popular microcomputer is described. The detector array consists of 128 photodiodes on 25‐μm centers and is sensitive to light in the visible portion of the spectrum. Details of the interface between the array and an Apple II microcomputer are given. The overall performance of the system is demonstrated for Fresnel diffraction by a single slit.

 

点击下载:  PDF (675KB)



返 回