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Submicron air-bridge interconnection process for complex gate geometries

 

作者: Magnus Persson,   Joakim Pettersson,  

 

期刊: Journal of Vacuum Science&Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena  (AIP Available online 1997)
卷期: Volume 15, issue 5  

页码: 1724-1727

 

ISSN:1071-1023

 

年代: 1997

 

DOI:10.1116/1.589361

 

出版商: American Vacuum Society

 

关键词: resists

 

数据来源: AIP

 

摘要:

A one-step electron-beam lithography process for fabrication of submicron air bridges is described. The fabrication principle is based on differing sensitivities of three layers of resist. By modulating the exposure dose it is possible to develop through all layers, the top layers only, or the center layer only (tunnels). We have fabricated the gate structure for making a quantum ring of 1 μm diameter on GaAs material, with five separate Ti/Au Schottky gates around and in the center of the ring, including an air-bridge connection to the center gate.

 

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