Very low threshold current operation of semiconductor ring lasers
作者:
T.Krauss,
P.J.R.Laybourn,
期刊:
IEE Proceedings J (Optoelectronics)
(IET Available online 1992)
卷期:
Volume 139,
issue 6
页码: 383-388
年代: 1992
DOI:10.1049/ip-j.1992.0065
出版商: IEE
数据来源: IET
摘要:
Semiconductor ring lasers with a threshold current as low as 12.5 mA have been fabricated in GaAs/AlGaAs. The low threshold current is due to a passivating layer of silicon nitride and an optimised fabrication process that results in very smooth sidewalls. The threshold current was analysed and it was found that a considerable part of the current is lost by spreading towards the inside of the pillbox structure. The remaining loss mechanisms were identified as internal loss (1 dB), coupling loss (7–8 dB) and scattering loss (2–4 dB). The scattering loss was found to be independent of the radius for radii between 30 μm and 145 μm. The L–I curve displays several kinks, which are explained by shifts of the mode position and thus the coupling ratio at the Y-junction due to temperature changes with pumping.
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