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High-resolution positron-annihilation-induced Auger electron spectrometer

 

作者: S. Yang,   H. Q. Zhou,   E. Jung,   A. H. Weiss,   P. H. Citrin,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1997)
卷期: Volume 68, issue 10  

页码: 3893-3897

 

ISSN:0034-6748

 

年代: 1997

 

DOI:10.1063/1.1148043

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Positron-annihilation-induced Auger electron spectroscopy (PAES) uses a beam of low-energy positrons to excite Auger transitions via annihilation of core electrons. This mechanism imbues PAES with a high degree of surface specificity and the ability to eliminate the large collisionally induced secondary-electron background typically present in conventional Auger spectra. Here, we describe a high-resolution PAES system with an energy resolution&Dgr;E/E=2.5&percent;,approximately five times better than previous PAES spectrometers. The system consists of a compact low-energy(∼10 eV)electrostatically focused positron beam and a large cylindrical mirror analyzer. High-resolution PAES spectra from Cu(100) and Ge(100) surfaces are presented to illustrate the capabilities of the system. Energy spectra of secondary electrons and reemitted positrons resulting from bombardment of the surface by low-energy positron are also presented. ©1997 American Institute of Physics.

 

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