Frictional imaging in a scanning near-field optical/atomic-force microscope by a thin step etched optical fiber probe
作者:
Hiroshi Muramatsu,
Norio Chiba,
Masamichi Fujihira,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 15
页码: 2061-2063
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.120446
出版商: AIP
数据来源: AIP
摘要:
Use of a thin step etched optical fiber probe in a scanning near-field optical/atomic-force microscope (SNOM/AFM) produced frictional imaging. The probe was fabricated by the etching of an optical fiber to decrease its diameter and sharpen the tip end with a HF solution and by irradiating aCO2laser beam to bend the tip. The spring constant of the thin probe is 100 times smaller than that of a conventional optical fiber probe, which allows the probe to be used as a contact AFM mode and in frictional imaging. ©1997 American Institute of Physics.
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