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Reliability of asic devices

 

作者: R.P. Thornton,  

 

期刊: Integrated Ferroelectrics  （Taylor Available online 1995）
卷期: Volume 9, issue 1-3  

页码: 87-93

 

ISSN:1058-4587

 

年代: 1995

 

DOI:10.1080/10584589508012911

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

The use of application-specific integrated circuits (ASICs) has become widespread; from use in sophisticated telecommunications equipment through to children's toys. However, aspects of design, fabrication and testing may not be as rigorous as for the standard components that they are replacing.

 

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