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Relationship between Hall constant and carrier densities in polycrystalline semiconductor film

 

作者: M. S. Bennett,  

 

期刊: Journal of Applied Physics  (AIP Available online 1985)
卷期: Volume 58, issue 9  

页码: 3470-3475

 

ISSN:0021-8979

 

年代: 1985

 

DOI:10.1063/1.335769

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A relationship has been derived between Hall constant and carrier densities in terms of two experimentally accessible quantities, the grain size and the intergrain barrier height. It is found that the carrier density as measured by the Hall effect can underestimate the average carrier density in the grain by up to an order of magnitude or more in some cases. These predictions are compared with experimental results.

 

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