Determination of transport parameters in fullerene films
作者:
G. Priebe,
B. Pietzak,
R. Ko¨nenkamp,
期刊:
Applied Physics Letters
(AIP Available online 1997)
卷期:
Volume 71,
issue 15
页码: 2160-2162
ISSN:0003-6951
年代: 1997
DOI:10.1063/1.119368
出版商: AIP
数据来源: AIP
摘要:
We report the electron and hole drift mobilities and the recombination lifetime in thin polycrystallineC60films. The data are obtained from photocurrent measurements involving an optical interference grating moving at variable velocity across the sample surface. Considerable degradation of the transport parameters is observed as the samples are exposed to air. The initial values for the electron and hole drift mobilities are1.3±0.2 cm2/V sand(2±1)×10−4 cm2/V s,respectively, and for the recombination lifetime(1.7±0.2)×10−6s. ©1997 American Institute of Physics.
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