AbstractIn the general application of the X‐ray spectrographic method, it is often difficult to obtain standards which closely approximate the unknown being analysed. One of the possible ways around this problem is to utilise a matrix correction procedure which does not, in principle, require large numbers of standard samples. One such method has been described by Birks and Criss and this paper describes the application of their program at the University of Florida where a wide variety of samples are encountered. Also discussed in the paper is the basis of the so‐called ‘Fundamental Parameter’ method which has provided the means of analysing with great accuracy certain binary and tertiary alloys. It seems that the method holds considerable promise for the analysis of ore deposits and the prediction of inter‐elemen