Abstract: Total reflection x‐ray diffraction studies of the formation and the geometrical structure of Al–Ge(100) interfaces

 

作者: Shang‐Lin Weng,   A. Y. Cho,   P. Eisenberger,  

 

期刊: Journal of Vacuum Science and Technology  （AIP Available online 1979）
卷期: Volume 16, issue 5  

页码: 1134-1134

 

ISSN:0022-5355

 

年代: 1979

 

DOI:10.1116/1.570175

 

出版商: American Vacuum Society

 

关键词: ALUMINIUM;GERMANIUM;INTERFACES;X−RAY DIFFRACTION;EPITAXY;MOLECULAR BEAMS;GALLIUM ARSENIDES;CRYSTALS;SUBSTRATES

 

数据来源: AIP

 

摘要:

 

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