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Fractal characterization of rough surfaces using secondary electrons

 

作者: C.S. Pande,   N. Louat,   R.A. Masumura,   S. Smith,  

 

期刊: Philosophical Magazine Letters  （Taylor Available online 1987）
卷期: Volume 55, issue 3  

页码: 99-104

 

ISSN:0950-0839

 

年代: 1987

 

DOI:10.1080/09500838708228739

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

We propose a novel and rapid method of measuring the total area of a rough surface using a scanning electron microscope. We show, under certain circumstances, that this area is almost exactly proportional to the secondary electron yield from the surface. The relationship of this measurement to fractal characterization is discussed.

 

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