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New technique for nondestructive examination of latent track etching

 

作者: J. Vacik,   J. Cervena,   V. Hnatowicz,   D. Fink,   R. Klett,  

 

期刊: Radiation Effects and Defects in Solids  （Taylor Available online 1997）
卷期: Volume 140, issue 3-4  

页码: 307-311

 

ISSN:1042-0150

 

年代: 1997

 

DOI:10.1080/10420159708216854

 

出版商: Taylor & Francis Group

 

关键词: Latent tracks;Selective etching;Particle transmission

 

数据来源: Taylor

 

摘要:

New technique for examination of latent track etching based on the transmission of charged particles is suggested and some of preliminary experimental results are presented proving the feasibility of the method.

 

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