Change of electrical resistivity of metal films bombarded with helium ions of low energy
作者:
A. Nomura,
M. Kanayama,
S. Kiyono,
期刊:
Journal of Applied Physics
(AIP Available online 1974)
卷期:
Volume 45,
issue 6
页码: 2394-2395
ISSN:0021-8979
年代: 1974
DOI:10.1063/1.1663603
出版商: AIP
数据来源: AIP
摘要:
Copper and gold evaporated films of thicknesses between 500 and 2500 Å have been bombarded at liquid‐nitrogen temperature with 4–10‐keV He ion beams. The electrical resistivities of these films increase with dose without saturation, and the values of these changes in the thinner films approach tens of &mgr;&OHgr; cm at a dose of 1017ions/cm2. About 80% of the resistivity changes induced in copper and about 60% of the resistivity changes induced in gold are recovered after annealing to 453 K. The remarkable peaks of the thermal recoveries are mainly observed in stage II. The nature of the evaporated metal films closely relates to the large resistivity changes, which are also affected by bombarding with low‐energy ions.
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