PROBING OF GUNN EFFECT DOMAINS WITH A SCANNING ELECTRON MICROSCOPE
作者:
G. Y. Robinson,
R. M. White,
N. C. MacDonald,
期刊:
Applied Physics Letters
(AIP Available online 1968)
卷期:
Volume 13,
issue 12
页码: 407-408
ISSN:0003-6951
年代: 1968
DOI:10.1063/1.1652493
出版商: AIP
数据来源: AIP
摘要:
The high‐field domains in a Gunn effect diode operating in the transit‐time mode have been probed with a pulsed electron beam in a scanning electron microscope. The collected secondary emission current, when plotted as a function of both time and distance, clearly shows the propagation from cathode to anode of a region of high electric field. The probing technique is shown to offer micron spatial and subnanosecond temporal resolution.
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