The measurement of surface resistivity
作者:
E.C.Salthouse,
D.S.McIlhagger,
期刊:
Proceedings of the IEE - Part A: Power Engineering
(IET Available online 1962)
卷期:
Volume 109,
issue 3S
页码: 41-44
年代: 1962
DOI:10.1049/pi-a.1962.0007
出版商: IEE
数据来源: IET
摘要:
Over a period of about 40 years no significant changes have been made in the methods recommended for the determination of the surface resistivity of dielectric materials. Recent work has shown that results obtained by these methods may not be accurate. The errors inherent in measurements of surface resistivity are caused by the shunt resistance through the bulk of the material and by contact resistance at the electrode-surface-film interface. The sources of these errors are discussed and methods of reducing them are recommended.
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