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Effects of divalent cation impurities on surface space charge in thin AgBr films

 

作者: H. A. Hoyen,   Y. T. Tan,  

 

期刊: Journal of Applied Physics  (AIP Available online 1974)
卷期: Volume 45, issue 10  

页码: 4363-4369

 

ISSN:0021-8979

 

年代: 1974

 

DOI:10.1063/1.1663059

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A model for the surface space‐charge layer in thin ionic films has been extended to include the effects of divalent cation impurities and the association of impurity‐cation vacancy complexes. The potential, electrostatic field, and defect distributions are shown to be dependent on film thickness. The fate of photogenerated electrons and holes is discussed relative to the field and defect distributions.

 

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