Effects of divalent cation impurities on surface space charge in thin AgBr films
作者:
H. A. Hoyen,
Y. T. Tan,
期刊:
Journal of Applied Physics
(AIP Available online 1974)
卷期:
Volume 45,
issue 10
页码: 4363-4369
ISSN:0021-8979
年代: 1974
DOI:10.1063/1.1663059
出版商: AIP
数据来源: AIP
摘要:
A model for the surface space‐charge layer in thin ionic films has been extended to include the effects of divalent cation impurities and the association of impurity‐cation vacancy complexes. The potential, electrostatic field, and defect distributions are shown to be dependent on film thickness. The fate of photogenerated electrons and holes is discussed relative to the field and defect distributions.
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