Measurement of multiple-electron emission in single field-emission events
作者:
M. A. Piestrup,
H. E. Puthoff,
P. J. Ebert,
期刊:
Journal of Applied Physics
(AIP Available online 1997)
卷期:
Volume 82,
issue 11
页码: 5862-5864
ISSN:0021-8979
年代: 1997
DOI:10.1063/1.366462
出版商: AIP
数据来源: AIP
摘要:
Thermal and field electron emission from a modified electron microscope W source were measured with an energy-dispersive counting system. Thermal-emission spectra were consistent with random emission of single electrons, while field-emission spectra were consistent with multiple-electron emission in random events. As many as 11 electrons were detected in isolated random field-emission events. ©1997 American Institute of Physics.
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