首页   按字顺浏览 期刊浏览 卷期浏览 Measurement of multiple-electron emission in single field-emission events
Measurement of multiple-electron emission in single field-emission events

 

作者: M. A. Piestrup,   H. E. Puthoff,   P. J. Ebert,  

 

期刊: Journal of Applied Physics  (AIP Available online 1997)
卷期: Volume 82, issue 11  

页码: 5862-5864

 

ISSN:0021-8979

 

年代: 1997

 

DOI:10.1063/1.366462

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Thermal and field electron emission from a modified electron microscope W source were measured with an energy-dispersive counting system. Thermal-emission spectra were consistent with random emission of single electrons, while field-emission spectra were consistent with multiple-electron emission in random events. As many as 11 electrons were detected in isolated random field-emission events. ©1997 American Institute of Physics.

 

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