Secondary Emission from Nichrome V, CuBe, and AgMg Alloy Targets Due to Positive Ion Bombardment
作者:
Michael J. Higatsberger,
H. L. Demorest,
Alfred O. Nier,
期刊:
Journal of Applied Physics
(AIP Available online 1954)
卷期:
Volume 25,
issue 7
页码: 883-886
ISSN:0021-8979
年代: 1954
DOI:10.1063/1.1721762
出版商: AIP
数据来源: AIP
摘要:
A mass spectrometer ion collector system has been devised for the investigation of secondary electron emission by impact of ions on surfaces. Results are reported for various ions incident on clean, baked (but not atomically clean) surfaces of AgMg, CuBe, and Nichrome V targets. For rare gas isotopic ions it is found that for a given energy ion the value of &ggr; varies approximately inversely with the square root of the mass.
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