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Fission fragment tracks in semiconducting layer structures

 

作者: D.Vernon Morgan,   L.T. Chadderton,  

 

期刊: Philosophical Magazine  (Taylor Available online 1968)
卷期: Volume 17, issue 150  

页码: 1135-1143

 

ISSN:0031-8086

 

年代: 1968

 

DOI:10.1080/14786436808223191

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

Fission fragment irradiation of a number of semiconducting materials establishes that permanent tracks are formed only when the conductivity is ≲2 × 103(ohm-cm)−1. The intermittent nature of particle tracks is a characteristic of layer structures and further analysis confirms that there is one ‘defect’ per sandwich plane crossed by the fission particle. The intermittency is ascribed to the reduced energy loss of the fission fragment when it travels in the interplanar channel.

 

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