Fission fragment tracks in semiconducting layer structures
作者:
D.Vernon Morgan,
L.T. Chadderton,
期刊:
Philosophical Magazine
(Taylor Available online 1968)
卷期:
Volume 17,
issue 150
页码: 1135-1143
ISSN:0031-8086
年代: 1968
DOI:10.1080/14786436808223191
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
Fission fragment irradiation of a number of semiconducting materials establishes that permanent tracks are formed only when the conductivity is ≲2 × 103(ohm-cm)−1. The intermittent nature of particle tracks is a characteristic of layer structures and further analysis confirms that there is one ‘defect’ per sandwich plane crossed by the fission particle. The intermittency is ascribed to the reduced energy loss of the fission fragment when it travels in the interplanar channel.
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