Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope
作者:
F. M. Battiston,
M. Bammerlin,
C. Loppacher,
R. Lu¨thi,
E. Meyer,
H.-J. Gu¨ntherodt,
F. Eggimann,
期刊:
Applied Physics Letters
(AIP Available online 1998)
卷期:
Volume 72,
issue 1
页码: 25-27
ISSN:0003-6951
年代: 1998
DOI:10.1063/1.120635
出版商: AIP
数据来源: AIP
摘要:
A feedback mechanism based on fuzzy logic has been applied to operate a combined atomic force microscope (AFM)/scanning tunneling microscope (STM), which is able to measure the resonance frequency shift&Dgr;fof the cantilever-type spring and the mean tunneling currentI¯tsimultaneously. Using a decision making logic, the microscope can be scanned over a heterogeneous surface without tip crash. On the conductive parts of the sample, the STM mode is preferred, whereas the noncontact (nc)-AFM mode is used on the poorly conductive parts of the surface. The transition from the STM mode to nc-AFM mode is performed smoothly with the fuzzy logic feedback. ©1998 American Institute of Physics.
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