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Optical investigation of atomic steps in ultrathin InGaAs/InP quantum wells grown by vapor levitation epitaxy

 

作者: P. C. Morais,   H. M. Cox,   P. L. Bastos,   D. M. Hwang,   J. M. Worlock,   E. Yablonovitch,   R. E. Nahory,  

 

期刊: Applied Physics Letters  (AIP Available online 1989)
卷期: Volume 54, issue 5  

页码: 442-444

 

ISSN:0003-6951

 

年代: 1989

 

DOI:10.1063/1.100946

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Ultrathin InGaAs/InP single quantum well structures, grown by chloride transport vapor levitation epitaxy, have been investigated by low‐temperature photoluminescence (PL). Well‐resolved multiple peaks are observed in the PL spectra, instead of an expected single peak. We attribute this to monolayer (a0/2=2.93 A˚) variations in quantum well (QW) thickness. Separate peak positions for QW thicknesses corresponding to 2–6 monolayers have been determined, providing an unambiguous thickness calibration for spectral shifts due to quantum confinement. The PL peak corresponding to two monolayers occurs at 1.314 eV, corresponding to an energy shift of 524 meV. Experimental data agree very well with a simple effective mass theory.

 

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